【準備中】IEC TC 65 Plenary Automation Forum 開催のご案内

開催日：2020年1月1日

＜IEC TC 65 Plenary Automation Forum＞

共同開催：IEC TC 65
　　　　　IEC TC 65国内委員会

　IEC TC 65 Plenary Automation Forumでは、IECやその他の国際標準化機関が策定した規格がどのように活用されているかについて、国際的なIEC専門家による講演を行うほか、日本の学界および産業界からのタイムリーな発表も予定されています。
　IEC TC 65は、産業プロセスの計測、制御、および自動化に関する国際規格の策定を担当しています。その範囲には、より良い社会を実現するための重要な要素である安全性とサイバーセキュリティ、そして今日非常に注目されている産業オートメーションにおけるAIが含まれます。
　これらのテーマに沿い、本フォーラムでは以下のTC 65の重点分野に関する講演を行います：
　- Product data and EU Digital Product Passport
　- Artificial intelligence
　- Industrial Communications
　- Industrial Safety
　- Cybersecurity

　皆様のご参加を、心よりお待ちしております。

※なお、本フォーラムは英語で実施され同時翻訳はございません。予めご了承ください。

日　時	2026年7月2日（木）9:00～18:00　受付開始：8:30
会　場	東京国際フォーラム　ホールD7 東京都千代田区丸の内3丁目5番1号（最寄り駅：JR・地下鉄有楽町駅、JR東京駅　「アクセス」）
開催形式	対面型開催（英語で実施され同時翻訳はございません。）
参加費	無料
定　員	50名（定員になり次第締め切らせていただきます。）
申　込	下記の「参加申込はこちら」よりお申込みください。
締　切	2026年6月24日（木）
問合せ	一般社団法人日本電気計測器工業会 IEC TC 65 国内委員会事務局電話：03-3662-8183　 E-mail：iec-tc65@jemima.or.jp
その他	IEC TC 65 Plenary Automation Forumのパンフレットはこちらよりダウンロードできます。 IEC TC65 Automation Forum.pdf

　【プログラム】

Time	Title/Speaker	Abstract
9:00	Opening / Rainer Schrundner, TC 65 Chair
9:15	Welcome Speech / Yoshiaki Kodachi, Director, International Electrotechnology Standardization Division Innovation and Environment Policy Bureau, METI	－
9:30	Open Data Spaces Reference Architecture Model (ODS-RAM) Michitaka Tsuda, IPA	Introduction of ODS-RAM (tentative)
10:00	EU Digital Product Passport Standardization Rainer Schrundner, TC 65 Chair	Upon request of the European Commission CEN and CENELEC are working on a set of standards for a framework for digital product passports (DPPs). Most parts are expected to get published this summer. These standards are agnostic of specific products and specific attributes required by legislators, and can serve as blueprints for DPP systems also in other parts of the world.
10:30	Break
11:00	FEMS as an enabler of all-electric and connected society (AECS) Implementing energy efficiency and flexibility in the industrial sector Tomoyuki Ikeyama, Yokogawa Electric Co. TC 65/JWG 17 Co-Convener	In response to increasing environmental requirements, such as AECS and the Digital Product Passport (DPP), this presentation highlights international standardization trends in energy efficiency including Industrial FEMS.
11:30	Key Performance Aspects for Smart Manufacturing DING Lu, ITEI	Smart manufacturing has driven companies into greater collaboration with supply chains and design chains. This presentation describes KPAs for smart manufacturing with a usage of KPIs, The KPAs are purpose-driven based upon evaluation of smart manufacturing. Existing KPIs that express a particular KPA are arranged into KPAs categories that enable the analysis or synthesis of KPAs. KPAs associated with KPIs are focused on the benefit that digital and intelligent technologies bring up to smart manufacturing, and help on the evaluation of the collaboration.
12:00	Implementing AI Robotics Safety Evaluation Yoshihiro Nakabo, AIST	This presentation introduces the activities of the AI Robotics Safety Working Group established within J-AISI, a Japanese government- led organization responsible for examining and promoting AI safety evaluation methods and standards, as well as the guidelines published in April as an outcome of these activities.
12:30	Lunch
14:00	Enabling Safe Human-Machine Collaboration -- An Overview of IEC 63662 Kazunari Tsukiyama, SC 65A/WG 24 Convener	Manufacturing systems increasingly require humans and machines to work safely together in various conditions, such as sharing the same workspace. IEC 63662, developed by IEC SC65A/WG24, introduces a framework for coordinating risk assessments performed by multiple stakeholders across the system lifecycle. This presentation provides an overview of the standard's background and key concepts.
14:30	AI Agents Christoph Legat, Technical University of Applied Sciences Augsburg, Convener IEC TC 65/WG 31	AI agents are becoming key players in industrial automation, operating, and coordinating machines, robots, and automated guided vehicles within adaptive socio-technical production systems. IEC TC 65 is spearheading this development with the first global unifying standardization of industrial AI agents and multi-agent systems. This initiative addresses the critical challenges of ensuring the safety, scalability, and trustworthiness of embodied AI in smart manufacturing. With multiple global projects underway, the working group on industrial AI agents is paving the way for the next generation of adaptive industrial systems.
15:00	A Benchmark Study on AI-Automated System Integration Yan LU, NIST	The rapid evolution of Large Language Models (LLMs) has introduced a potential paradigm shift in industrial system integration: the ability to bypass traditional, neutral data models in favor of direct, AI-generated "point-to-point" code. This presentation details a comprehensive benchmark study comparing three distinct integration methodologies within the Additive Manufacturing (AM) to Manufacturing Execution System (MES) digital thread, including Model-Free (Standards-Free), Model-Driven (Standards-Based) and AI-Assisted Modeling.
15:30	Industrial Automation Product Data Erich Barnstedt, Microsoft Corporation, TC 65/JWG 29 Co-convener,	Industrial product data will become increasingly important in the next few years as manufacturers enter dataspaces like Catena-X and of course with the requirements mandated by the European Commission with its Digital Product Passport initiative. We present an end-to-end solution for industrial product data sharing, leveraging existing and upcoming IEC standards.
16:00	Break
16:30	Cybersecurity (standardization, organizations, alignment efforts) Alex Nicoll, Rockwell Automation, TC 65/WG 10 Co-convener	A discussion of the complex ecosystem surrounding the IEC 62443 series of standards, including coordinating multiple SDOs and branching due to regulatory requirements.
17:00	Perspective of ICS Cyber Security in Japan Toshio Miyachi, JPCERT Coordination Center (Expert Advisor)	The trail of ICS cyber security in Japan, its current state and future challenges toward the next stage are discussed.
17:30	5G Communication in Automation Satoko Itaya, Ph.D., Director of Industrial Wireless Systems Laboratory Advanced Connectivity Bridge, NICT	In recent years, there are many wireless systems implemented in manufacturing field. We introduce challenge of usage of wireless technology for manufacturing systems and a new initiative through industry-academia-government collaboration aimed creating a world where everyone can easily utilize wireless technology in factories.
18:00	Closing / Takaharu Matsumoto, Plenary Chair